Power and Energy Efficiency

Measure Power and Energy efficiency with Tektronix

Ensure safe, precise and fast Si, SiC and GaN MOSFET testing in a lab and a wafer test environment. Learn more about the testing challenges resulting from the adoption of SiC and GaN into your designs and how to solve them. Discover how to minimize power draw and maximize battery life for your end-products. Accelerate the time-to-market for your designs.

Measure Power and Energy efficiency with Hioki

PDF’s and case studies

Solving Connection Challenges in On-Wafer Power Semiconductor Device Test

Learn how to minimize connection changes, opportunities for user error, and frustration when performing comprehensive DC I-V and C-V testing of power semiconductor devices.

Solving Connection Challenges in On-Wafer Power Semiconductor Device Test

Panasonic Semiconductor Solutions Case Study

Tektronix IsoVu measurement systems help Panasonic Semiconductor Solutions significantly shorten development time for new GaN device.

Panasonic-Case-Study_51W-60856-0_110916

Accurately Measuring High Speed GaN Transistors

Efficient Power Conversion describes proper measurement techniques when making measurements on their GaN FETs.  This EPC application note shows how to use the Tektronix IsoVu Optically Isolated Probe System to make accurate, repeatable measurements, thanks to extremely high common mode rejection.

Accurately Measuring High Speed GaN Transistors

Measuring Ultra-Low Power in Wireless Sensor Nodes

This application note provides information on how to characterize the power consumption of a wireless sensor node.

Measuring Ultra-Low Power in Wireless Sensor Nodes