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Detectus RSE 644 EMC Scanner

Detectus RSE 644 EMC Scanner

Price on request

Earlier emission measurements had to be made by specialists. With the EMC scanner anyone can make a measurement and draw conclusions from the informative and easily interpreted re­ports. You do not even need to have access to a screened room to make the measurements. The software runs in Windows on a standard PC and is intuitive and user-friendly. Since the system is configurable for most modern spectrum analyzers, you can use your own and do not have to purchase a new one

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Detectus RSE 644 EMC Scanner

Using the EMC-Scanner during the early stages of design enables you to detect potential emission problems before they become integrated into the product and expensive to correct. If a product has failed a test at a test house, normally you only know which frequency failed. You don’t get to know the location of the source. The EMC-Scanner can help you find the source and repeated measurements while redesigning your product helps you lower the emission levels.

The EMC-Scanner can help you maintain a high quality in the production line. You can make measurements on samples from the production line and easily compare them with a reference. That way you can make sure that, for example, a change of supplier for a component doesn’t affect the emission spectra in a negative way.

RSE 644

Measurable volume: 600x400x400 mm

Movement in XYZ-axis: 600x400x200 mm

Size: 920x700x950 mm

Weight: 37 kg

 

Visual Noise Detection

Emission measurement result

The patented EMC-scanner measures the emission from PCB’s,  components, cables and products. The system consists of an

X-Y-Z robot, a spectrum analyzer with near field probe and a standard PC with custom software and a GPIB card or similar for communicating with the spectrum analyzer. During measurement the near field probe is moved by the robot to a grid of measuring points above the test object. At each measuring point the location of the probe and the value of the emission intensity is stored in the computer. After the measurement the results can be documented in different types of reports.

Objective comparative EMC measurements with different de-coupling

Objective comparative measurements

One of the most useful features of the EMC Scanner system is that it enables you to make truly objective comparative measurements.

 

To the left, you can see an example of comparative measurements. The six measurements show the same test object and the same frequency. The difference is the value of the de-coupling capacitor of one IC.

 

MultiScan

A MultiScan measurement

The MultiScan measurement enables you to generate field plots from any frequency within the measured wide band span. This powerful feature is a major improvement and it gives an enormous amount of information. Looking at the screen dump to the right, the main part of the screen shows the field plot of the frequency selected in the top left graph.

The top left graph shows the accumulated trace (a max hold spectra of all measuring points).

The top right graph shows the wide band spectra from a user selectable spot on the field plot.

3D measuring point on STL surface model

Import 3D surface models

Now you can import 3D surface models in STL file format and create measuring points that follow the surface at a fixed distance. 3D surface models can easily be aligned to the measurement using the 3-point alignment feature.

 

 

High Resolution Heat Scanning

Print screen of a heat scanning measurement result

The scanner system also includes a Heat-Scanner feature.

Heat scanner is a high-resolution measuring system for anyone wishing to measure temperature accurately and inexpensively. The measurements are presented graphically as either two or three-dimensional images.

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