Keithley 2520 Pulsed Laser Diode Test System
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- Channels - 1
- Max Current Source/Measure Range - 5A
- Max Voltage Source/Measure Range - 10V
- Power - 50 W
- Measurement Resolution (Current / Voltage) - 700nA / 0.33mV
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Keithley 2520 Pulsed Laser Diode Test System
The Model 2520 Pulsed Laser Diode Test System is an integrated, synchronized system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. The Model 2520 provides all sourcing and measurement capabilities needed for pulsed and continuous LIV (light-currentvoltage) testing of laser diodes in one compact, half-rack instrument. The tight synchronization of source and measure capabilities ensures high measurement accuracy, even when testing with pulse widths as short as 500ns.
Keithley instrumentation makes it easy to build a LIV (light-current-voltage) system to test laser diode modules cost-effectively.
- 2520 Pulse Laser Diode Test System: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test.
- TEC SourceMeter SMUs, 2510 and 2510-AT: Ensure tight temperature control for laser diode modules by controlling its thermo-electric cooler.
Features | Benefits |
| Active temperature control | Prevents temperature variations that could cause the laser diode’s dominant output wavelength to change, leading to signal overlap and crosstalk problems. |
| 50W TEC Controller | Allows for higher testing speeds and a wider temperature setpoint range than other, lower-power solutions. |
| Fully digital P-I-D control | Provides greater temperature stability and can be easily upgraded with a simple firmware change. |
| Autotuning capability for the thermal control loop (2510-AT) | Eliminates the need to use trial-and-error experimentation to determine the best combination of P, I, and D coefficients. |
| Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C) | Covers most of the test requirements for production testing of cooled optical components and sub-assemblies. |
| Compatible with a variety of temperature sensor inputs—thermistors, RTDs, and IC sensors | Works with the types of temperature sensors most commonly used in a wide range of laser diode modules. |
| AC Ohms measurement function | Verifies the integrity of the TEC device. |
| 4-wire open/short lead detection for thermal feedback element | Eliminates lead resistance errors on the measured value, reducing the possibility of false failures or device damage. |
For more information:Tektronix
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Keithley 2520 Pulsed Laser Diode Test System
The Model 2520 Pulsed Laser Diode Test System is an integrated, synchronized system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. The Model 2520 provides all sourcing and measurement capabilities needed for pulsed and continuous LIV (light-currentvoltage) testing of laser diodes in one compact, half-rack instrument. The tight synchronization of source and measure capabilities ensures high measurement accuracy, even when testing with pulse widths as short as 500ns.
Keithley instrumentation makes it easy to build a LIV (light-current-voltage) system to test laser diode modules cost-effectively.
- 2520 Pulse Laser Diode Test System: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test.
- TEC SourceMeter SMUs, 2510 and 2510-AT: Ensure tight temperature control for laser diode modules by controlling its thermo-electric cooler.
Features | Benefits |
| Active temperature control | Prevents temperature variations that could cause the laser diode’s dominant output wavelength to change, leading to signal overlap and crosstalk problems. |
| 50W TEC Controller | Allows for higher testing speeds and a wider temperature setpoint range than other, lower-power solutions. |
| Fully digital P-I-D control | Provides greater temperature stability and can be easily upgraded with a simple firmware change. |
| Autotuning capability for the thermal control loop (2510-AT) | Eliminates the need to use trial-and-error experimentation to determine the best combination of P, I, and D coefficients. |
| Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C) | Covers most of the test requirements for production testing of cooled optical components and sub-assemblies. |
| Compatible with a variety of temperature sensor inputs—thermistors, RTDs, and IC sensors | Works with the types of temperature sensors most commonly used in a wide range of laser diode modules. |
| AC Ohms measurement function | Verifies the integrity of the TEC device. |
| 4-wire open/short lead detection for thermal feedback element | Eliminates lead resistance errors on the measured value, reducing the possibility of false failures or device damage. |
For more information:Tektronix