Keithley 2015-P Audio Analyzing DMM @ 220V

The Keithley 2015-P Audio Analyzing Digital Multimeter and the Keithley 2015 Total Harmonic Distortion Multimeter combine audio band quality measurements and analysis with a full-function 6½-digit DMM. Test engineers can make a broad range of voltage, resistance, current, frequency, and distortion measurements, all with the same compact, half-rack measurement instrument. The 2015-P offers additional processing capacity for frequency spectrum analysis.

Key Features

• THD, THD+Noise, and SINAD measurements
• 20 Hz–20 kHz sine wave generator
• Fast frequency sweeps
• 2015-P identifies peak spectral components
• Sine wave generator maximum amplitude: 4 Vrms single-ended or 8 Vrms differential output
• Individual harmonic magnitude measurements
• 5 standard audio shaping filters
• 13 DMM functions (6½ digits)
• GPIB and RS-232 interfaces

Frequency Domain Distortion Analysis

For applications such as assessing non-linear distortion in components, devices, and systems, DSP-based processing allows the 2015 and 2015-P to provide frequency domain analysis in conventional time domain instruments. They can measure Total Harmonic Distortion (THD) over the complete 20 Hz to 20 kHz audio band. They also measure over a wide input range (up to 750 Vrms) and have low residual distortion (–87 dB). The THD reading can be expressed either in decibels or as a percentage. In addition to THD, the 2015 and 2015-P can compute THD+Noise and Signal-to-Noise plus Distortion (SINAD). For analyses in which the individual harmonics are the criteria of greatest interest, the instruments can report any of the (up to 64) harmonic magnitudes that can be included in the distortion measurements. The user can program the actual number of harmonics to be included in a computation, so accuracy, speed, and complexity can be optimized for a specific application. (See Figure 1.)

Optimized for Production Testing

The 2015 and 2015-P can perform fast frequency sweeps for characterizing audio-band circuitry in production test systems. For example, the instruments can execute a single sweep of 30 frequencies and transmit both rms voltage readings and THD readings to a computer in only 1.1 seconds. With that data, a complete frequency response analysis and a harmonic distortion vs. frequency analysis can be performed in a very short time. Thus high speed testing of the audio performance of a high volume device such as a cellular telephone can be performed without reducing the number of tests or reducing the measurements in each test. With these instruments, which are optimized for production testing, test engineers can lower test times, in comparison to test speeds achievable with general purpose audio analyzers, without sacrificing production test quality.

For more information: Tektronix

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