Wentworth S200D Double-sided Probe Station
Price on request
- Simultaneous, double-sided probing of up wafers up to 200 mm (8″)
- Unique caliper arm and probe needle design
- Adjustable wafer size carriers
- Tuneable gram force and speed settings
- TTL, Ethernet (10BaseT), RS232 and IEEE 488 control interface
Wentworth S200D Double-sided Probe Station
Wentworth S200D Double-sided Probe Station
Additional information
Producent | Wentworth Laboratories |
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Produktkategori | Wafer Probe Stations |